JTAG/Boundary Scan is possibly the most resourceful test technology which, similar to the In-Circuit Test (ICT) but without physical nail contact to all nets, utilises virtual test points to detect the failure location – even under BGAs and on high-speed nets.
EP-TeQ now offers a number of Embedded Board Test trainings to get you acquainted with this important technology:
Invitation for 1-day training sessions
Invitation for 2-day training sessions
You can also choose a Starter Kit which includes hardware, software and basic training for 2 or 3 days:
SCANBOOSTERTM Designer Studio Kit